New Model-Free Analysis: Dynamic Arrhenius

Model free analysis Dynamic Arrhenius for Temperature-of-event values at different heating rates: like OOT (Onset Oxidation temperature), sample rupture during DMA tests, thermal degradation of packaging.

It calculates activation energy and pre-exponential factor for dynamic measurements at different heating rates for the event (OOT etc). No complete measurement is necessary, only two values for each measurement: time and temperature.